About the Speaker
Global Director, Innovation & Continuous Improvement Methodologies, Warranty
Nexteer Automotive
Jeff is a Global Director at Nexteer Automotive with 35 years experience in analytics and structured problem solving. He is a Six Sigma Master Black Belt with additional certifications in a variety of methodologies. He led the deployment of structured problem solving across Nexteer and prior to that at Delphi Automotive. He has trained and coached hundreds in statistical thinking from the shop floor through the C-suite and the Board of Directors. More recently, Jeff has been active in helping to leverage shop floor data to reduce variation, quickly detect anomalies, and enhance overall value in operations. He holds a Master’s degree in Business Administration with a focus in Management Science from the University of Michigan, as well as a Bachelor of Science in Mechanical Engineering from Michigan Technological University.
About the Session
Roundtable Topic: Developing a Collaborative Quality Culture that Puts Problem-Solving First
- Data needs and ease of communication across the entire value stream
- Role of front-line service technicians and diagnosis methods
- Data mining trends for early identification of design/manufacturing issues
